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首页 > 推广型号列表 >XCS05XLVQ100

XCS05XLVQ100

XCS05XLVQ100资料
XCS05XLVQ100
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File Size : 116 KB
Manufacturer:XILINX
Description:As with any semiconductor device, some of the characteristics of HEXFET Power MOSFETs are temperature dependent. For tests in which there is significant heating of the HEXFET Power MOSFET, a low repetition rate should be used. For tests involving a slow transition through the linear region, a damping resistor of at least 10 ohms should be connected in series with the gate, close to the gate lead to prevent oscillations. If frequent testing of MOS-gated devices is expected, the use of a test fixture that plugs directly into the curve tracer would save a significant amount time. Such a fixture is descibed in Section 12. MOS-gated transistors are static sensitive. Wrist straps, grounding mats and other ESD precautions must be followed, as indicated in INT-955.
 
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型 号:XCS05XLVQ100
厂 家:XILINX
封 装:QFP
批 号:07+
数 量:2000
说 明:100%真实库存,原装,部分现货
 
 
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